Formation and self-breaking mechanism of stable atom-sized junctions
Formation and self-breaking mechanism of stable atom-sized junctions
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DOI：
10.1021/nl073003j
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发表时间：
2008-01-01
期刊：
影响因子：
10.8
通讯作者：
Kawai, Tomoii
中科院分区：
文献类型：
--
作者：
Tsutsui, Makusu;Shoji, Kohei;Kawai, Tomoii
通过研究原子尺度接触的稳定性，研究了金结的自击穿机制。当结拉伸速度降低时，单原子接触寿命从0.02 s增加到200 s，而断裂力则随结拉伸速度的降低而减小。我们发现，结自破过程涉及足够的原子重排，从而允许外部引入的应变在0.8 pm/s的完全自补偿。本研究结果对制备稳定的单分子结具有重要意义。
The self-breaking mechanism of gold junctions is studied by investigating stability of the atom-sized contacts. The single atom contact lifetime increases from about 0.02 to 200 s upon decreasing the junction stretching speed, while at the same time, the breaking force diminishes logarithmically. We find that the junction self-breaking processes involve sufficient atomic rearrangements, which thereby allow complete self-compensation of externally introduced strain at 0.8 pm/s. The present results have important implications on fabrication of stable single molecule junctions.