Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture.
Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture.
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DOI：
10.1107/s1600577513034644
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发表时间：
2014-03
影响因子：
2.5
通讯作者：
H. Takano;S. Konishi;T. Koyama;Y. Tsusaka;S. Ichimaru;T. Ohchi;H. Takenaka;Y. Kagoshima
中科院分区：
文献类型：
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作者：
H. Takano;S. Konishi;T. Koyama;Y. Tsusaka;S. Ichimaru;T. Ohchi;H. Takenaka;Y. Kagoshima
提出了一种测量X射线多层波带片聚焦光束点扩散函数的实验方法。通过对由焦平面上每个径向方向上的线扩展函数（LSF）组成的测量数据集应用层析成像过程，可以重建PSF。LSF的测量采用刀口扫描法检测散射强度。在实验工作中，准单色波荡器辐射的第一谐波能量为20 keV的直接聚焦没有单色器的MZP，并使用该程序测量PSF。其结果是，近衍射极限的聚焦光束的尺寸为46 nm的半峰全宽获得。
The experimental procedure for obtaining the point spread function (PSF) of a focusing beam generated using an X-ray multilayer zone plate (MZP) with a narrow annular aperture has been developed. It was possible to reconstruct the PSF by applying the tomographic process to the measured dataset consisting of line spread functions (LSFs) in every radial direction on the focal plane. The LSFs were measured by a knife-edge scanning method of detecting scattered intensity. In the experimental work, quasi-monochromatic undulator radiation with a first harmonic energy of 20 keV was directly focused without a monochromator by the MZP, and the PSF was measured using this procedure. As a result, a near diffraction-limited focused beam size of 46 nm full width at half-maximum was obtained.