23.2 A 5Gb/s/pin 8Gb LPDDR4X SDRAM with power-isolated LVSTL and split-die architecture with 2-die ZQ calibration scheme
23.2 A 5Gb/s/pin 8Gb LPDDR4X SDRAM with power-isolated LVSTL and split-die architecture with 2-die ZQ calibration scheme
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23.2 5Gb/s/pin 8Gb LPDDR4X SDRAM,具有电源隔离 LVSTL 和带 2 芯片 ZQ 校准方案的分体芯片架构
DOI:
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发表时间:
2017
期刊:
影响因子:
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通讯作者:
G. Jin
中科院分区:
文献类型:
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作者:
Chang;Yoon;Jin;Junha Lee;Hye;Kihan Kim;Young;Ho;Jonghyuk Kim;Jong;Seungjun Shin;Hanna Park;Su;Young;Hoon Lee;Kyong;Jae;Hyo;Kyoung;Jung;Soobong Chang;H. Hwang;Du;Yoon;S. Hyun;Joonbae Park;Yoon;Youn;H. Kwon;Seung;T. Oh;Indal Song;Yong;J. Choi;Kwang;Seong;G. Jin
With growing demand for low-power mobile applications, such as wearable devices, smart phones and tablet PCs, low-power mobile DRAM has been identified as a mandatory requirement for low-power system designs. The recently developed LPDDR4 [1] is still a power efficient solution because of its architectural approaches and low-voltage-swing terminated logic (LVSTL). However, demand for enhanced power-efficiency beyond LPDDR4 is still increasing for mobile applications. In this work, a 5.0Gbp/s/pin 8Gb LPDDR4X memory with power-isolated low-voltage-swing terminated logic (PI-LVSTL) and a split-die architecture is proposed to enhance power-efficiency and mass production yield.