Systematics of strongly correlated ternary 4f compounds on the plane hybridization—f-level occupancy

Systematics of strongly correlated ternary 4f compounds on the plane hybridization—f-level occupancy
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强相关三元4f化合物在平面杂化上的系统学——f级占据

DOI:
10.1016/j.jmmm.2006.10.506
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发表时间:
2007
影响因子:
2.7
通讯作者:
J. Spałek
J. Spałek
中科院分区:
材料科学3区
文献类型:
--
作者:
A. Ślebarski;J. Spałek

文献摘要

被引文献

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我们比较了各种三元化合物CeMX(M-金属:Rh,Pd,Ni和X=Sb,Sn或Al)的行为类型,与早期的安德森晶格模型内获得的理论相图。特别地,我们将这些化合物定位在平面杂化与4f能级占据的相图上。这些参数已被确定实验从X射线光电子能谱使用Gunnarson-Schönhammer方法。此外,我们比较了4f磁矩的值,以及总态密度。除了CeRhSb和CeNiSn的近藤绝缘间隙值外,该协议是良好的。
We compare the type of behavior of various ternary compounds CeMX (M-metal: Rh, Pd, Ni, and X=Sb, Sn or Al), with the earlier theoretical phase diagram obtained within the Anderson-lattice model. In particular, we locate those compounds on this phase diagram on the plane hybridization vs. 4f-level occupancy. Those parameters have been determined experimentally from the X-ray photoemission spectra using the Gunnarson–Schönhammer approach. Additionally, we compare the values of the 4f-magnetic moment, as well as the total density of states. The agreement is good except for the value of the Kondo insulating gap for CeRhSb and CeNiSn.