STM study of the nucleation and annealing of ion bombardment induced defects on Cu(100)
STM study of the nucleation and annealing of ion bombardment induced defects on Cu(100)
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Cu(100)离子轰击缺陷成核和退火的STM研究
DOI:
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发表时间:
1994
期刊:
影响因子:
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通讯作者:
J. Klein
中科院分区:
文献类型:
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作者:
J. Girard;Y. Samson;S. Gauthier;S. Roussel;J. Klein