Inertial measurement with trapped particles: A microdynamical system
Inertial measurement with trapped particles: A microdynamical system
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DOI:
10.1063/1.3360808
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发表时间:
2010-04-05
影响因子:
4
通讯作者:
Gershenfeld, Neil
中科院分区:
文献类型:
--
作者:
Post, E. Rehmi;Popescu, George A.;Gershenfeld, Neil
We describe an inertial measurement device based on an electrodynamically trapped proof mass. Mechanical constraints are replaced by guiding fields, permitting the trap stiffness to be tuned dynamically. Optical readout of the proof mass motion provides a measurement of acceleration and rotation, resulting in an integrated six degree of freedom inertial measurement device. We demonstrate such a device-constructed without microfabrication-with sensitivity comparable to that of commercial microelectromechanical systems technology and show how trapping parameters may be adjusted to increase dynamic range.