Nanospectroscopy at Elettra
Nanospectroscopy at Elettra
复制标题
Elettra 的纳米光谱学
DOI：
10.1080/08940889908261030
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发表时间：
1999
影响因子：
--
通讯作者：
K. Prince
中科院分区：
文献类型：
--
作者：
S. Heun;T. Schmidt;B. Ressel;E. Bauer;K. Prince
第三代储存环产生的X射线的高亮度和强度导致过去几年光谱显微镜活动的强劲增长。一些例子是ESCA显微镜[11，光谱显微镜12 1，光谱光电发射和低能电子显微镜（SPELEEM）[3]，ALS的各种显微镜光束线[4]，以及Bessy I1的SMART项目[5]。一般来说，这些仪器可以分为两个不同的类：扫描型显微镜和直接成像显微镜。在第一类中，光被聚焦成样品上的一个小点，其大小决定了显微镜的横向分辨率。在后一种情况下，样品被均匀地照射，并且显微镜的横向分辨率由检测方法确定。Elettra提供具有横向分辨率的光谱学的光束线是两台扫描显微镜ESCA显微镜和光谱显微镜以及直接成像SPELEEM。所有三个都位于波荡器光束线的出口处。表1简要比较了它们的性能。在这篇文章中，我们将说明SPELEEM的应用之一。首先，我们将简要介绍该工具。
The high brilliance and intensity of the X-rays produced by third generation storage rings has led to a strong increase of spectromicroscopy activities over the past few years. Some examples are the ESCA-microscopy [11, Spectromicroscopy 12 1, the spectroscopic photoemission and low energy electron microscope (SPELEEM)[3] at Elettra, the various microscopy beamlines at the ALS [4], and the SMART project at Bessy I1 [5]. In general, these instruments can be divided into two different classes: the scanning type microscopes and the direct imaging microscopes. In the first class, the light is focused into a small spot on the sample, whose size determines the lateral resolution of the microscope. In the latter case, the sample is homogeneously illuminated, and the lateral resolution of the microscope is determined by the detection method. The beamlines at Elettra which provide spectroscopy with lateral resolution are the two scanning microscopes ESCA-microscopy and Spectromicroscopy and the direct imaging SPELEEM. All three are located at the exits of undulator beamlines. A brief comparison of their performance is given in Table 1. In this article we will illustrate one of the applications of SPELEEM. First, we will give a brief description of the instrument.