Ferromagnetic Resonance in Thin Films of Permalloy
Ferromagnetic Resonance in Thin Films of Permalloy
复制标题
坡莫合金薄膜中的铁磁共振
DOI：
10.1103/physrev.105.377
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发表时间：
1957
期刊：
影响因子：
--
通讯作者：
M. Seavey
中科院分区：
文献类型：
--
作者：
P. Tannenwald;M. Seavey
在厚度为760 - 1600埃的蒸发（82%Ni，18%Fe）膜中进行了微波共振测量。最长的弛豫时间，由线宽测量，给出T2 = 3× 10− 8秒。样品厚度等于或小于趋肤深度，导致洛伦兹型线。根据形状各向异性理论，得到了多重共振。
Microwave resonance measurements have been made in evaporated (82% Ni, 18% Fe) films of thickness 760 A to 1600 A. The longest relaxation, as measured by the line width, gives T 2= 3× 10− 8 sec. The sample thickness was equal to or less than the skin depth, resulting in a Lorentzian-type line. Multiple resonances were obtained according to shape anisotropy theory.