Study on scribing characteristics of wafer with precision of ground scribing wheel

Study on scribing characteristics of wafer with precision of ground scribing wheel
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磨削划线轮精密晶圆划片特性研究

DOI:
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发表时间:
2017
期刊:
Proceedings of 16th euspen International Conference
影响因子:
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通讯作者:
N. Tomei
N. Tomei
中科院分区:
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文献类型:
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作者:
Y. Akiyama;M. Okada;Y. Masuda;H. Suzuki;T. Funishi;Y. Asai;N. Ogasawara;K. Iizuka;N. Tomei

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