Identification of local silicon cluster nanostructures inside Si(x)Ge(1-x) alloy nanocrystals by Raman spectroscopy.
Identification of local silicon cluster nanostructures inside Si(x)Ge(1-x) alloy nanocrystals by Raman spectroscopy.
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DOI：
10.1039/c0cc01277g
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发表时间：
2010-07
影响因子：
4.9
通讯作者：
L. Liu;X. Wu;J. Shen;T. H. Li;F. Gao;P. Chu
中科院分区：
文献类型：
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作者：
L. Liu;X. Wu;J. Shen;T. H. Li;F. Gao;P. Chu
通过对Si（x）Ge（1-x）纳米晶镶嵌SiO2薄膜的拉曼光谱的实验研究和理论分析，我们发现430 cm（-1）Si-Si光学声子模可以作为一个指纹来识别高硅含量的Si（x）Ge（1-x）纳米晶内部局部硅团簇纳米结构的存在。
By experimentally examining and theoretically analyzing the Raman spectra of Si(x)Ge(1-x) nanocrystal-embedded silica films, we show that the 430 cm(-1) Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside Si(x)Ge(1-x) nanocrystals with high silicon content.