Common bias readout for TES array on Scanning Transmission Electron Microscope
Common bias readout for TES array on Scanning Transmission Electron Microscope
复制标题
扫描透射电子显微镜上 TES 阵列的通用偏置读数
DOI:
10.1007/s10909-016-1562-4
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发表时间:
2016
影响因子:
2
通讯作者:
T.Hara
中科院分区:
文献类型:
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作者:
R.Yamamoto;K.Sakai;K.Maehisa;K.Nagayoshi;T.Hayashi;H.Muramatsu;Y.Nakashima;K.Mitsuda;N.Y.Yamasaki;Y.Takei;M.Hidaka;S.Nagasawa;K.Maehata;T.Hara
A transition edge sensor (TES) microcalorimeter array as an X-ray sensor for a scanning transmission electron microscope system is being developed. The technical challenge of this system is a high count rate of5000 counts/second/array. We adopted a 64 pixel array with a parallel readout. Common SQUID bias, and common TES bias are planned to reduce the number of wires and the resources of a room temperature circuit. The reduction rate of wires is 44 % when a 64 pixel array is read out by a common bias of 8 channels. The possible degradation of the energy resolution has been investigated by simulations and experiments. The bias fluctuation effects of a series connection are less than those of a parallel connection. Simple calculations expect that the fluctuations of the common SQUID bias and common TES bias in a series connection areand, respectively. We constructed 8 SQUIDs which are connected to 8 TES outputs and a room temperature circuit for common bias readout and evaluated experimentally. Our simulation of crosstalk indicates that at an X-ray event rate of 500 cps/pixel, crosstalk will broaden a monochromatic line by about 0.01 %, or about 1.5 eV at 15 keV. Thus, our design goal of 10 eV energy resolution across the 0.5–15 keV band should be achievable.