3d core-level X-ray photoelectron spectroscopy of EuCu 2 Si 2 , a mixed-valence system
3d core-level X-ray photoelectron spectroscopy of EuCu 2 Si 2 , a mixed-valence system
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混合价系 EuCu 2 Si 2 的 3d 核心级 X 射线光电子能谱
DOI：
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发表时间：
1981
期刊：
影响因子：
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通讯作者：
B. D. Padalia
中科院分区：
文献类型：
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作者：
L. C. Gupta;E. Sampathkumaran;R. Vijayaraghavan;V. Prabhawalkar;P. Prabhawalkar;B. D. Padalia
铕在eucu2si2中的三维核能级x射线光电子能谱（XPS）表现出两组简单的自旋轨道分裂结构。我们将这些结构分配到eucu2si2中Eu的两种不同的价态（Eu 2+和Eu 3+）。2+峰和3+峰的相对强度是温度的强烈函数。首次利用Eu三维区域的XPS来研究价涨落现象。指出了铕的三维核能级光谱研究相对于四维和四维光谱研究的优势。
3d core-level X-ray photoelectron spectrum (XPS) of Eu in EuCu 2 Si 2 exhibits two sets of simple spin-orbit split structures. We have assigned these structures to two different valence states of Eu (Eu 2+ and Eu 3+ ) in EuCu 2 Si 2 . The relative intensities of 2+ and 3+ peaks are strong functions of temperature. XPS in the 3d region of Eu has been employed for the first time to study the phenomenon of valence fluctuation. The relative advantage of 3d core-level spectroscopy of Eu over 4d and 4f spectral studies is brought out.