Crystallographic slip activity fields identified automatically from DIC data, even for intersecting, diffuse and cross slip
Crystallographic slip activity fields identified automatically from DIC data, even for intersecting, diffuse and cross slip
复制标题
从 DIC 数据自动识别晶体滑移活动场，甚至是交叉滑移、扩散滑移和交叉滑移
DOI：
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发表时间：
2022
期刊：
影响因子：
--
通讯作者：
J. Hoefnagels
中科院分区：
文献类型：
--
作者：
T. Vermeij;R. Peerlings;M. Geers;J. Hoefnagels
晶体学滑移系识别方法被广泛用于表征金属的细尺度变形。虽然强大和广泛使用，他们通常依赖于离散滑移带的出现，具有清晰的滑移痕迹，并在发生交叉滑移，弯曲滑移，分散滑移和/或交叉滑移等机制时挣扎。本文提出了一种新的滑移系识别框架，其中测量的位移梯度场（来自数字图像相关）与一个或多个组合滑移系的运动学相匹配。为了确定符合测量运动学的滑移量，针对每个数据点单独求解优化问题，从而为每个考虑的滑移系统产生滑移活动场。识别框架的证明和验证HCP虚拟实验，离散和离散滑移，纳入24滑移系统。FCC和BCC金属的实验案例研究表明，即使考虑BCC的48个滑移系统，离散滑移、离散滑移和交叉滑移的全场识别也是可行的。此外，该方法被扩展成一个专用的交叉滑动识别方法，直接产生的局部滑动平面轨迹取向的方向，纯粹基于测量的运动学和一个或两个选定的滑动方向。对于更具有挑战性的情况下，揭示了一个持久的不确定性的滑移识别，两步识别方法可以采用，证明了一个高度挑战性的HCP虚拟实验。
Crystallographic slip system identification methods are widely employed to characterize the fine scale deformation of metals. While powerful and widely employed, they usually rely on the occurrence of discrete slip bands with clear slip traces and struggle when mechanisms such as cross-slip, curved slip, diffuse slip and/or intersecting slip occur. This paper proposes a novel slip system identification framework in which the measured displacement gradient fields (from Digital Image Correlation) are matched with the kinematics of one or multiple combined slip systems. To identify the amounts of slip that conform to the measured kinematics, an optimization problem is solved for every datapoint individually, resulting in a slip activity field for every considered slip system. The identification framework is demonstrated and validated on an HCP virtual experiment, for discrete and diffuse slip, incorporating 24 slip systems. Experimental case studies on FCC and BCC metals show how full-field identification of discrete slip, diffuse slip and cross-slip becomes feasible, even when considering 48 slip systems for BCC. Moreover, the methodology is extended into a dedicated cross-slip identification method, which directly yields the orientation of the local slip plane trace orientation, purely based on the measured kinematics and on one or two chosen slip directions. For even more challenging cases revealing a persistent uncertainty in the slip identification, a two-step identification approach can be employed, as is demonstrated on a highly challenging HCP virtual experiment.
影响因子：
9.4
作者：
Harte, A.;Atkinson, M.;da Fonseca, J. Quinta
通讯作者：
da Fonseca, J. Quinta
影响因子：
9.8
作者：
Bieler, T. R.;Eisenlohr, P.;Raabe, D.
通讯作者：
Raabe, D.