Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements
Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements
复制标题
全反射XAFS测量研究表面活性剂吸附膜中二元混合抗衡离子的分布
DOI:
10.1016/j.jcis.2012.08.044
复制
发表时间:
2012
影响因子:
9.9
通讯作者:
et al
中科院分区:
文献类型:
--
作者:
Yosuke Imai;et al
The total reflection X-ray absorption fine structure (TR-XAFS) technique was applied to adsorbed films at the surface of aqueous solutions of surfactant mixtures composed of dodecyltrimethylammonium bromide (DTAB) and dodecyltrimethylammonium tetrafluoroborate (DTABF4). The obtained XAFS spectra were expressed as linear combinations of two specific spectra corresponding to fully hydrated bromide ions (free-Br) and partially dehydrated bromide ions adsorbed to the hydrophilic groups of surfactant ions (bound-Br) at the surface. The ratio of free- and bound-Br ions was determined as a function of surface tension and surface composition of the surfactants. Taking also the results in our previous studies on the DTAB – dodecyltrimethylammonium chloride (DTAC) and 1-hexyl-3-methylimidazolium bromide (HMIMBr) – 1-hexyl-3-methylimidazolium tetrafluoroborate (HMIMBF4) mixed systems into consideration, the relation between counterion distribution and miscibility of counterions at the solution surface was deduced for the surfactant mixtures having common surfactant ions but different counterions.