A parameterization of low visibilities for hazy days in the North China Plain
A parameterization of low visibilities for hazy days in the North China Plain
复制标题
华北平原雾霾天低能见度参数化
DOI：
10.5194/acp-12-4935-2012
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发表时间：
2012-06
影响因子：
6.3
通讯作者：
中科院分区：
文献类型：
--
作者：
摘要。能见度下降是中国一个普遍而紧迫的环境问题。华北平原低能见度事件频繁发生，气溶胶负荷高，吸湿性强。基于能见度、相对湿度（RH）、气溶胶吸湿生长因子和中国雾霾（HaChi）项目测量的颗粒数大小分布，提出了雾霾天气低能见度消光（Kex）的参数化方法。观测结果表明，在相对湿度为90%时，高气溶胶体积浓度是造成能见度低的主要原因，能见度的降低主要受相对湿度增加的影响。Kex的参数化是在气溶胶体积浓度和相对湿度的基础上发展起来的，同时考虑了能见度对这两个因素的敏感性和相应数据的可用性。用参数化方案计算的消光系数与直接测量值吻合较好。
Abstract. Visibility degradation is a pervasive and urgent environmental problem in China. The occurrence of low visibility events is frequent in the North China Plain, where the aerosol loading is quite high and aerosols are strongly hygroscopic. A parameterization of light extinction (Kex) for low visibilities on hazy days is proposed in this paper, based on visibility, relative humidity (RH), aerosol hygroscopic growth factors and particle number size distributions measured during the Haze in China (HaChi) Project. Observational results show that a high aerosol volume concentration is responsible for low visibility at RH 90%, decrease of visibility is mainly influenced by the increase of RH. The parameterization of Kex is developed on the basis of aerosol volume concentrations and RH, taking into accounts the sensitivity of visibility to the two factors and the availability of corresponding data. The extinction coefficients calculated with the parameterization schemes agree well with the directly measured values.
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影响因子：
5.2
作者：
D. Hegg;D. Covert;K. Crahan;H. Jonssen
通讯作者：
D. Hegg;D. Covert;K. Crahan;H. Jonssen
影响因子：
6.3
作者：
Zhang, Q. H.;Zhang, Q. H.;Zhang, J. P.;Zhang, J. P.;Xue, H. W.;Xue, H. W.
通讯作者：
Xue, H. W.
影响因子：
1.4
作者：
N. Motallebi;T. Cahill;R. Flocchini
通讯作者：
N. Motallebi;T. Cahill;R. Flocchini
影响因子：
5
作者：
C. Sloane
通讯作者：
C. Sloane
影响因子：
6.3
作者：
B. Wehner;W. Birmili;F. Ditas;Zhijun Wu;Min Hu;Xingang Liu;J. Mao;N. Sugimoto;A. Wiedensohler-A.-Wiedenso
通讯作者：
B. Wehner;W. Birmili;F. Ditas;Zhijun Wu;Min Hu;Xingang Liu;J. Mao;N. Sugimoto;A. Wiedensohler-A.-Wiedenso