Yuji Saito: "Improvement of MOSFET Subthreshold Leakage Current by its Irradiation with Hydrogen Radicals Generated in Microwave-Excited High-Density Inert Gas Plasma"2001 IEEE international reliability physics symposium. 47・11. 319-326 (2001)
Yuji Saito: "Improvement of MOSFET Subthreshold Leakage Current by its Irradiation with Hydrogen Radicals Generated in Microwave-Excited High-Density Inert Gas Plasma"2001 IEEE international reliability physics symposium. 47・11. 319-326 (2001)
复制标题
Yuji Saito:“通过微波激发高密度惰性气体等离子体中产生的氢自由基来改善 MOSFET 亚阈值漏电流”2001 IEEE 国际可靠性物理研讨会 47・11。
DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
中科院分区:
文献类型:
--
作者: