Electrochemical nanopatterning of Ag on solid-state ionic conductor RbAg4I5 using atomic force microscopy
Electrochemical nanopatterning of Ag on solid-state ionic conductor RbAg4I5 using atomic force microscopy
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DOI：
10.1063/1.1807964
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发表时间：
2004-10-18
影响因子：
4
通讯作者：
Gür, TM
中科院分区：
文献类型：
--
作者：
Lee, M;O'Hayre, R;Gür, TM
本报告介绍了一种在环境条件下进行的电化学纳米图案化技术，无需液体容器或探针到样品的材料转移。图案化是通过使用原子力显微镜探针在固体离子导体 RbAg4I5 表面上进行 Ag 簇的固态电化学纳米沉积来完成的。相对于 RbAg4I5 样品上的银膜对电极，在探针上施加负电压脉冲会在探针周围的离子导体上诱导纳米级的银沉积。图案化银颗粒的高度为 0.5-70 nm，直径为 20-700 nm。还显示了偏置电压的幅度和持续时间对沉积银团簇的尺寸和形状的影响。 (C) 2004 年美国物理研究所。
This report introduces an electrochemical nanopatterning technique performed under ambient conditions without involving a liquid vessel or probe-to-sample material transfer. Patterning is accomplished by solid-state electrochemical nanodeposition of Ag clusters on the surface of the solid ionic conductor RbAg4I5 using an atomic force microscopy probe. Application of negative voltage pulses on the probe relative to an Ag film counter electrode on an RbAg4I5 sample induces nanometer-sized Ag deposition on the ion conductor around the probe. The patterned Ag particles are 0.5-70 nm high and 20-700 nm in diameter. The effect of the amplitude and duration of bias voltage on the size and shape of deposited Ag clusters is also shown. (C) 2004 American Institute of Physics.