Total Electron Yield Soft X-ray Absorption Spectroscopy in the C K Region of the Mixtures of Graphitic Carbons and Diamond for Quantitative Analysis of the sp2/sp3-Hybridized Carbon Ratio
Total Electron Yield Soft X-ray Absorption Spectroscopy in the C K Region of the Mixtures of Graphitic Carbons and Diamond for Quantitative Analysis of the sp2/sp3-Hybridized Carbon Ratio
复制标题
石墨碳和金刚石混合物 C K 区域的总电子产率软 X 射线吸收光谱用于 sp2/sp3 杂化碳比率的定量分析
DOI：
10.1143/jjap.48.066514
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发表时间：
2009
影响因子：
1.5
通讯作者：
E. Gullikson
中科院分区：
文献类型：
--
作者：
Y. Muramatsu;K. Shimomura;T. Katayama;E. Gullikson
为了阐明利用C-K区的全电子产额（TEY）X射线吸收光谱（XAS）定量分析碳材料中sp2杂化碳（sp2-C）和sp3-C的可能性，我们测量了多壁碳纳米管或炭黑作为sp2-C源和金刚石作为sp3-C源的混合物的TEY-XAS。C-K TEY-XAS中的π*/σ* 峰强度比与sp2-C的重量（原子）%之间的测量关系可以通过sp2-C和sp3-C组分的总和TEY并考虑sp3-C相对于sp2-C，k的TEY效率来成功地解释。然而，实验测定的k值表明，即使取决于单个碳组分的化学形式和/或电子性质，sp3-C的TEY也比sp2-C的TEY小约一个数量级。这表明，在使用TEY-XAS对碳材料进行定量sp2/sp3分析之前，需要进一步评估TEY效率。
To elucidate the possibility of quantitatively analyzing sp2-hybridized carbon (sp2-C) and sp3-C in carbon materials using total-electron-yield (TEY) X-ray absorption spectra (XAS) in the C K region, we measured the TEY-XAS of mixtures of multi-walled carbon nanotubes or carbon black as sp2-C sources and diamond as an sp3-C source. The measured relationship between the π*/σ* peak intensity ratio in the C K TEY-XAS and the weight (atomic)% of sp2-C can be successfully explained by the summed TEY of the sp2-C and sp3-C components and considering the TEY efficiency of sp3-C relative to sp2-C, k. However, the experimentally determined k values show that TEY of the sp3-C is much smaller than that of sp2-C by about one order of magnitude, even depending on the chemical form and/or electronic properties of individual carbon components. This suggests that further evaluation of the TEY efficiency is necessary prior to the quantitative sp2/sp3 analysis of carbon materials using the TEY-XAS.
采用高分辨率软 X 射线光谱法表征日本烟熏屋顶瓦“Ibushi-Kawara”上的碳膜
DOI：
--
发表时间：
2003
期刊：
Jpn.J.Appl.Phys. 42
影响因子：
--
作者：
T.Kimura;T.Murai;Y.Muramatsu et al.
通讯作者：
Y.Muramatsu et al.
使用 NEXSAFS 测量对各种方法形成的 DLC 薄膜进行综合分类
DOI：
--
发表时间：
2008
期刊：
Diamond and Related Materials 17
影响因子：
--
作者：
Akihiko Saikubo;Noriko Yamada;Kazuhiro Kanda;Shinji Matsui;Tsuneo Suzuki;Koichi Niihara;Hidetoshi Saitoh
通讯作者：
Hidetoshi Saitoh