X-Ray Fluorescence Holography of SrTiO_3 Compared with X-Ray Photoelectron Holography
X-Ray Fluorescence Holography of SrTiO_3 Compared with X-Ray Photoelectron Holography
复制标题
SrTiO_3的X射线荧光全息与X射线光电子全息比较
DOI：
10.2116/analsci.14.903
复制
发表时间：
1998
影响因子：
1.6
通讯作者：
Y. Gohshi
中科院分区：
文献类型：
--
作者：
J. Kawai;K. Hayashi;Tokujirou Yamamoto;S. Hayakawa;Y. Gohshi
测量了 SrTiO_3 (001) 单晶的锶 K_α X 射线荧光强度作为检测方位角和极角的函数。由于固体中荧光X射线的干涉作用，观察到各向异性。从化学分析的角度讨论X射线荧光全息术。将X射线光电子强度各向异性与目前的测量结果进行比较。
Strontium K _α X-ray fluorescence intensity of SrTiO_3 (001) single crystal is measured as a function of azimuthal and polar angles of detection. Anisotropy is observed due to the interference effect of fluorescent X-rays in the solid. X-Ray fluorescence holography is discussed from the viewpoint of chemical analysis. X-Ray photoelectron intensity anisotropy is compared with the present measurement.