Yoshikazu Nakai, Seiichirou Fukuhara, and Kenji Ohnishi: "Microscopic observation of fatigue slip bands and fatigue cracks by scanning atomic force microscopy" Proceedings of the of the Japan Society of Mechanical Engineers. No.96-1, Vol.2. 418-419 (1996)
Yoshikazu Nakai, Seiichirou Fukuhara, and Kenji Ohnishi: "Microscopic observation of fatigue slip bands and fatigue cracks by scanning atomic force microscopy" Proceedings of the of the Japan Society of Mechanical Engineers. No.96-1, Vol.2. 418-419 (1996)
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Yoshikazu Nakai、Seiichirou Fukuhara 和 Kenji Ohnishi：“通过扫描原子力显微镜对疲劳滑移带和疲劳裂纹进行微观观察”日本机械工程师学会会议录。
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