Intrinsic backgrounds from Rn and Kr in the XENON100 experiment
Intrinsic backgrounds from Rn and Kr in the XENON100 experiment
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DOI：
10.1140/epjc/s10052-018-5565-y
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发表时间：
2018-02-16
影响因子：
4.4
通讯作者：
Zhang, Y.
中科院分区：
文献类型：
--
作者：
Aprile, E.;Aalbers, J.;Zhang, Y.
在本文中，我们描述了XENON100数据分析，用于评估目标本征背景源氡(222Rn)、Thoron(Rn-220)和氪(Kr-85)。我们详细描述了高能阿尔法粒子和衰变特定延迟重合的事件选择。我们得出了探测器内单个放射性核素的分布，并在实验的三次主要科学运行期间(从2010年1月至2014年1月)对其丰度进行了量化。我们将我们的结果与外部测量的氡发射和氪浓度进行了比较，发现两者吻合得很好。我们报告了观察到的氡子体浓度的降低，我们将其归因于负偏压阴极上带电离子的电镀。
In this paper, we describe the XENON100 data analyses used to assess the target-intrinsic background sources radon (222Rn), thoron (Rn-220) and krypton (Kr-85). We detail the event selections of high-energy alpha particles and decay-specific delayed coincidences. We derive distributions of the individual radionuclides inside the detector and quantify their abundances during the main three science runs of the experiment over a period of similar to 4 years, from January 2010 to January 2014. We compare our results to external measurements of radon emanation and krypton concentrations where we find good agreement. We report an observed reduction in concentrations of radon daughters that we attribute to the plating-out of charged ions on the negatively biased cathode.