An Improved Analysis of Reliability and Entropy for Delay PUFs
An Improved Analysis of Reliability and Entropy for Delay PUFs
复制标题
延迟 PUF 可靠性和熵的改进分析
DOI：
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发表时间：
2018
期刊：
影响因子：
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通讯作者：
O. Rioul
中科院分区：
文献类型：
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作者：
Alexander Schaub;J. Danger;S. Guilley;O. Rioul
物理不可克隆功能（PUF）已被用于各种应用中，诸如设备认证、敏感数据的安全存储和防伪。不同的应用需要PUF提供不同级别的可靠性。然而，到目前为止，还没有开发出表征PUF可靠性的预测模型。这对于具有低错误率的PUF尤其是一个问题，因为错误率越低，获得良好估计所需的测量次数越大。在本文中，我们开发了一个预测框架，它使我们能够推导出几个延迟PUF家族的熵和可靠性的封闭形式的表达式：环形振荡器（RO）PUF，RO和PUF以及环路PUF。通过比特过滤提高可靠性，我们提供了复杂性、可靠性和熵之间的明确权衡。可以实现低至10^-9甚至更低的错误率。我们的理论结果通过在65 nm CMOS ASIC技术中实现的Loop PUF上的实验进行了验证，还用于模拟RO PUF和RO总和PUF的行为。
Physically unclonable functions (PUF) have been used in various applications, such as device authentication, secure storage of sensitive data, and anti-counterfeiting. Different applications require various levels of reliability from the PUF. However, as of today, no predictive model to characterize the PUF reliability has been developed. This is particularly a problem for PUFs with low error rates, because the lower the error rate, the larger the number of measurements required to obtain a good estimate. In this paper, we develop a predictive framework, which enables us to derive a closed-form expression of both entropy and reliability for several families of delay PUFs: the ring oscillator (RO) PUF, the RO sum PUF as well as the Loop PUF. Improving reliability with bit-filtering, we provide an explicit tradeoff between complexity, reliability and entropy. Error rates as low as 10^-9 or even lower can be achieved. Our theoretical results are validated by experiments on Loop PUFs implemented in 65 nm CMOS ASIC technology, also used to simulate the behavior of the RO PUF and the RO sum PUF.