Surface morphological studies of Nafion®/Pt(100) interface
Surface morphological studies of Nafion®/Pt(100) interface
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Nafion®/Pt(100) 界面的表面形态研究
DOI：
10.1016/j.electacta.2014.08.086
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发表时间：
2014
影响因子：
6.6
通讯作者：
H. Baltruschat
中科院分区：
文献类型：
--
作者：
S. Iqbal;N. Podgaynyy;M. Ahmed;G. A. Attard;H. Baltruschat
在Nafion®膜/电极界面发生的结构和分子过程仍然知之甚少。本研究旨在使用扫描探针技术（即STM和AFM）阐明Pt（100）/Nafion®界面的纳米级性质。在STM中，Nafion®薄膜的表面形态在原子尺度上看起来很光滑;基底的单原子台阶清晰可见。使用AFM针尖穿透实验以及通过从电极表面刮擦Nafion®层来确定Nafion®膜的厚度。力偏转（“接近”）曲线表明，尖端以大于5 nN的法向力穿透Nafion®层。
The structure and molecular processes occurring at the Nafion® membrane/electrode interface remain poorly understood. The present study aims at elucidating the nano-scale properties of the Pt(100)/Nafion® interface using scanning probe techniques, namely STM and AFM. In STM, the surface morphology of the thin Nafion® film appears smooth on the atomic scale; monoatomic steps of the substrate are well visible. The thickness of the Nafion® membrane is determined using AFM tip penetration experiments and also by scratching of the Nafion® layer from the electrode surface. Force deflection (“approach”) curves demonstrate that the tip penetrates the Nafion® layer at a normal force greater than 5 nN.