Atom Probe Microscopy of Self-Assembled Monolayers: Preliminary Results
Atom Probe Microscopy of Self-Assembled Monolayers: Preliminary Results
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DOI：
10.1021/la904459k
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发表时间：
2010-04-20
期刊：
影响因子：
3.9
通讯作者：
Ringer, Simon P.
中科院分区：
文献类型：
--
作者：
Gault, Baptiste;Yang, Wenrong;Ringer, Simon P.
利用原子探针层析成像技术（APT）对金属表面的十硫醇自组装单层（SAMs）进行了三维成像。本文提供了Ni[001]和Au[111]的初步结果，显示了sam的APT分析潜力。并详细介绍了标本制备和数据处理方法的发展。重要的是，对SAMs分析的质谱调查显示，在金属衬底和有机材料之间的界面上没有硫和氢的结合，这可能为衬底上硫醇的结合提供了新的见解。
We have achieved three-dimensional imaging of decanethiol self-assembled monolayers (SAMs) on metal surfaces by atom probe tomography (APT). The present Letter provides preliminary results on Ni [001] and Au [111], shows the analytical potential of APT analysis of SAMs. and details developments in specimen preparation and in data-treatment methodologies. Importantly, the investigation of the mass spectra from analysis of the SAMs revealed no combination of sulfur and hydrogen at the interface between the metal substrates and the organic materials, potentially providing insight about the bonding of the thiols on the substrate.