Temperature-dependent phonon conduction and nanotube engagement in metalized single wall carbon nanotube films.
Temperature-dependent phonon conduction and nanotube engagement in metalized single wall carbon nanotube films.
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DOI：
10.1021/nl100443x
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发表时间：
2010-05
期刊：
影响因子：
10.8
通讯作者：
M. Panzer;H. Duong;J. Okawa;J. Shiomi;B. Wardle;S. Maruyama;K. Goodson
中科院分区：
文献类型：
--
作者：
M. Panzer;H. Duong;J. Okawa;J. Shiomi;B. Wardle;S. Maruyama;K. Goodson
界面决定了碳纳米管阵列的热阻。本工作采用纳秒热反射测温法分离界面和体积电阻为10微米厚的对齐单壁碳纳米管薄膜涂有铝，钛，钯，铂，镍。我们通过定义纳米管-金属接合因子来解释数据，该因子决定界面电阻，并使用测量的薄膜热容量提取。金属-SWNT和SWNT-衬底电阻分别在3.8和9.2 mm（2）K/W和33-46 mm（2）K/W之间。在125和300 K之间测量的热容数据的温度依赖性与理论预测吻合得很好。由金属-单壁碳纳米管界面电阻数据表明的温度依赖性表明非弹性声子传输。
Interfaces dominate the thermal resistances in aligned carbon nanotube arrays. This work uses nanosecond thermoreflectance thermometry to separate interface and volume resistances for 10 microm thick aligned SWNT films coated with Al, Ti, Pd, Pt, and Ni. We interpret the data by defining the nanotube-metal engagement factor, which governs the interface resistance and is extracted using the measured film heat capacity. The metal-SWNT and SWNT-substrate resistances range between 3.8 and 9.2 mm(2)K/W and 33-46 mm(2)K/W, respectively. The temperature dependency of the heat capacity data, measured between 125 and 300 K, is in good agreement with theoretical predictions. The temperature dependence demonstrated by the metal-SWNT interface resistance data suggests inelastic phonon transmission.