Synchronizing shared abstract types
Synchronizing shared abstract types
复制标题
同步共享抽象类型
DOI:
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发表时间:
1984
期刊:
影响因子:
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通讯作者:
A. Spector
中科院分区:
文献类型:
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作者:
P. Schwarz;A. Spector
Experimental data on transient errors from several digital computer systems is presented and analyzed. This is the first large scale public study on the statistical distribution of transient errors. The systems for which data has been collected are the DEC PDP-10 scries computers, the Cm* multiprocessor, and the C.vmp fault tolerant microprocessor. Statistical tests indicate that transient errors follow a decreasing hazard rate distribution. This is at variance with the standard assumption of constant hazard rates (exponential distribution) used in reliability modeling, and requires models of greater complexity for accurate results. Models of common fault tolerant redundant structures are developed using the Weibul! distribution, which has a time-varying hazard rate. Both analytical and simulation models arc used to analyze die differences between the reliabilities predicted by Weibull based transient error models and those predicted by exponential based models. The analysis indicates a significant difference between the models based on the exponential distribution and those based on the decreasing hazard rate Weibull distribution. Reliability differences ranging from -0.10 to +0.20 and factors greater than 2.0 in Mission Time Improvement for Weibull parameters equivalent to measured system behavior arc seen in the model results. System designers should be aware of these differences. Transient Error Reliability Models Based on Data Analysis