Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits
Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits
复制标题
数字 CMOS 电路中互连开路引起的振荡和时序行为
DOI：
10.1109/test.1997.639668
复制
发表时间：
1997
期刊：
影响因子：
--
通讯作者：
F. Ferguson
中科院分区：
文献类型：
--
作者：
H. Konuk;F. Ferguson
短裤和打开是当今CMOS IC中最常见的缺陷类型。在本文中，我们首次表明，数字CMOS电路的互连接线中的打开可能会导致振荡或顺序行为。我们还分析并比较影响互连打开的概率的因素，并分析反馈桥接故障，以振荡或显示顺序行为。
Shorts and opens are the most common types of defects in today's CMOS ICs. In this paper we show for the first time that an open in the interconnect wiring of a digital CMOS circuit can cause oscillation or sequential behavior. We also analyze and compare the factors affecting the probabilities for an interconnect open and a feedback bridging fault to oscillate or display sequential behavior.