X-ray line broadening due to an inhomogeneous dislocation distribution
X-ray line broadening due to an inhomogeneous dislocation distribution
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DOI：
10.1103/physrevb.57.7535
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发表时间：
1998-04-01
影响因子：
3.7
通讯作者：
Groma, I
中科院分区：
文献类型：
--
作者：
Groma, I
本文提出了位错引起X射线谱线展宽的一般理论。结果表明，决定加宽线轮廓形状的主导项与实际位错分布无关。强度分布可以由位错组态的平均参数（如位错密度及其波动）来表征。为了确定这些参数，提出了威尔逊方差法的推广形式。
A general theory of x-ray line broadening caused by dislocations is presented. It is shown that the leading terms determining the shape of the broadened line profile are independent of the actual dislocation distribution. The intensity distribution can be characterized by average parameters of the dislocation configuration, like the dislocation density, and its fluctuation. For the determination of these parameters a generalized form of Wilson's variance method is proposed.