Measuring the scintillation decay time for different energy depositions in NaI:Tl, LSO:Ce and CeBr3 scintillators
Measuring the scintillation decay time for different energy depositions in NaI:Tl, LSO:Ce and CeBr3 scintillators
复制标题
测量 NaI:Tl、LSO:Ce 和 CeBr3 闪烁体中不同能量沉积的闪烁衰减时间
DOI：
10.1016/j.nima.2014.02.045
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发表时间：
2014
影响因子：
1.4
通讯作者：
T. Szczesniak
中科院分区：
文献类型：
--
作者：
L. Swiderski;M. Moszynski;A. Syntfeld;M. Szawłowski;T. Szczesniak
这项研究提出了一种简单的实验装置，用于精确检查闪烁体衰变特性作为闪烁体中沉积能量的函数。讨论了 NaI:Tl、LSO:Ce 和 CeBr3 晶体的结果。测试样品与 Hamamatsu 的快速响应 R5320 光电倍增管耦合。通过拟合直接用泰克 TDS5054B 数字示波器记录的 PMT 阳极脉冲来测量衰减时间常数。由定时单通道分析仪、门发生器和符合/逻辑单元组成的简单模拟电子器件用于选择在闪烁体内转换为光的沉积能量，并触发示波器记录相关闪烁脉冲。实验装置的高精度允许记录所有样品的非比例曲线。此外，分别测量了 NaI:Tl 的快速和慢速衰减模式的非比例性。该测量还用于检查康普顿散射事件和光吸收引起的脉冲形状可能存在的差异。
This study presents a simple experimental setup for precise inspection of scintillation decay characteristics as a function of the energy deposited in scintillators. The results are discussed for NaI:Tl, LSO:Ce and CeBr3crystals. The tested samples were coupled to a fast response R5320 photomultiplier from Hamamatsu. The decay time constants were measured by fitting the anode pulses of the PMT registered directly with a TDS5054B digital oscilloscope from Tektronix. Simple analog electronics composed of timing single channel analyzers, gate generators and coincidence/logic unit was used for selection of the deposited energy converted into light within the scintillator, and for triggering the scope to register relevant scintillation pulses. High precision of the experimental setup allowed for registration of non-proportionality curves for all samples. Moreover, non-proportionality was measured for fast and slow decay mode of NaI:Tl separately. The measurement was also used for inspection of possible differences in the pulse shapes originating from Compton scattering events and photoabsorption.