Diffusion Cooling of Electrons in Afterglow Plasmas

Diffusion Cooling of Electrons in Afterglow Plasmas
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余辉等离子体中电子的扩散冷却

DOI:
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发表时间:
1972
期刊:
影响因子:
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通讯作者:
J. H. Ingold
J. H. Ingold
中科院分区:
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文献类型:
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作者:
A. Bhattacharya;J. H. Ingold

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报道了低压稀有气体余辉等离子体中正原子离子数密度衰减的质量鉴别测量结果。在高气压下,原子离子的损失是由于转换成分子离子和通过双极扩散到容器壁。在低压下,原子离子的损失仅通过扩散到壁,但速度比双极扩散慢;这种缓慢的损失速率被解释为重稀有气体中电子扩散冷却的表现。对扩散冷却进行了半定量的理论解释,并与Ne和Ar余辉中电子衰减率和Ne余辉中离子衰减率的测量结果相一致。与Ar,Kr,和Ar的离子衰变测量的比较也给出了。
The results of mass‐identified measurements of the decay of positive atomic ion number densities in low‐pressure rare‐gas afterglow plasmas are reported. At high gas pressure, the loss of atomic ions is due to conversion into molecular ions and by ambipolar diffusion to the wall of the container. At low pressures, the loss of atomic ions is only by diffusion to the wall but at a slower rate than that of ambipolar diffusion; this slow loss rate is interpreted as a manifestation of electron diffusion cooling in heavy rare gases. A semi‐quantitative theoretical explanation of diffusion cooling is offered and shown to be in good agreement with the results of measurements of electron decay rates in Ne and Ar afterglows and of ion decay rates in Ne afterglows. Comparison with ion decay measurements in Ar, Kr, and Xe are also given.