Waveform Observation of Digital Single-Event Transients Employing Monitoring >Transistor Technique
Waveform Observation of Digital Single-Event Transients Employing Monitoring >Transistor Technique
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DOI：
10.1109/tns.2008.2006836
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发表时间：
2008-12
影响因子：
1.8
通讯作者：
D. Kobayashi;K. Hirose;Y. Yanagawa;H. Saito;V. Ferlet-Cavrois;D. McMorrow;P. Paillet;M. Ohno
中科院分区：
文献类型：
--
作者：
D. Kobayashi;K. Hirose;Y. Yanagawa;H. Saito;V. Ferlet-Cavrois;D. McMorrow;P. Paillet;M. Ohno
通过将两个晶体管连接到目标逻辑门，可以观察数字单事件瞬态、逻辑门中辐射感应电压瞬态的波形。其他晶体管通过其漏极电流监控电压瞬变，可以使用广泛用于测量单个基本晶体管瞬态电流的传统 50 Ω 传输线技术来测量电压瞬变。脉冲激光辐照测试中获得的实验结果证明了观察技术的有效性，并清楚地揭示了脉冲演化作为激光脉冲能量的函数。
Waveforms of digital single-event transients, radiation-induced voltage transients in logic gates, can be observed by connecting two transistors to a target logic gate. Additional transistors monitor voltage transients through their drain currents, which can be measured using the conventional 50-Omega transmission-line technique widely used for measuring transient currents in single elementary transistors. Experimental results obtained in pulsed-laser irradiation tests demonstrate the validity of the observation technique and clearly reveal the pulse evolution as a function of the laser pulse energy.