Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping
Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping
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DOI：
10.1063/1.5135644
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发表时间：
2020-01-13
影响因子：
4
通讯作者：
Hofmann, Stephan
中科院分区：
文献类型：
--
作者：
Lin, Hungyen;Burton, Oliver J.;Hofmann, Stephan
我们演示了如何使用反射几何中的太赫兹时域光谱（THz-TDS）对通过硅支撑的大面积化学气相沉积石墨烯薄膜进行定量电导率测绘。我们根据使用已建立的基于 THz-TDS 的传输进行的测量来验证该技术。我们的穿透基底方法允许不受阻碍地进入石墨烯顶表面，因此，正如我们所讨论的，开辟了使用环境细胞进行原位和操作中 THz-TDS 的途径。
We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.