H-aggregate analysis of P3HT thin films-Capability and limitation of photoluminescence and UV/Vis spectroscopy.

H-aggregate analysis of P3HT thin films-Capability and limitation of photoluminescence and UV/Vis spectroscopy.
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DOI:
10.1038/srep32434
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发表时间:
2016-09-01
期刊:
影响因子:
4.6
通讯作者:
Schmidt-Mende L
Schmidt-Mende L
中科院分区:
综合性期刊3区
文献类型:
--
作者:
Ehrenreich P;Birkhold ST;Zimmermann E;Hu H;Kim KD;Weickert J;Pfadler T;Schmidt-Mende L

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聚合物的形态和聚集对聚合物电子器件中载流子的高效输运和电荷分离起着至关重要的作用。将h -聚集体模型应用于紫外/可见或光致发光光谱是分析聚合物聚集的常用方法。在这项工作中,我们提出的策略,以获得可靠的和结论性的信息聚合和形态基于h聚集体分析的应用,对紫外/可见和光致发光光谱。我们证明,以P3HT为模型系统,厚度相关的反射行为可能导致h -聚集体模型中UV/Vis光谱的误解。当聚合物厚度低于150纳米时,激子带宽的值会偏离两倍。相比之下,光致发光光谱是表征聚合物聚集的可靠基础,因为它们对聚合物的波长相关折射率的依赖性较弱。我们通过研究通常用于有机和混合太阳能电池的自旋涂覆薄膜的表面特性对聚合物聚集的影响来证明这一点。
Polymer morphology and aggregation play an essential role for efficient charge carrier transport and charge separation in polymer-based electronic devices. It is a common method to apply the H-aggregate model to UV/Vis or photoluminescence spectra in order to analyze polymer aggregation. In this work we present strategies to obtain reliable and conclusive information on polymer aggregation and morphology based on the application of an H-aggregate analysis on UV/Vis and photoluminescence spectra. We demonstrate, with P3HT as model system, that thickness dependent reflection behavior can lead to misinterpretation of UV/Vis spectra within the H-aggregate model. Values for the exciton bandwidth can deviate by a factor of two for polymer thicknesses below 150 nm. In contrast, photoluminescence spectra are found to be a reliable basis for characterization of polymer aggregation due to their weaker dependence on the wavelength dependent refractive index of the polymer. We demonstrate this by studying the influence of surface characteristics on polymer aggregation for spin-coated thin-films that are commonly used in organic and hybrid solar cells.
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