Fiber-based probe for electrooptic sampling
Fiber-based probe for electrooptic sampling
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DOI：
10.1109/lpt.2006.876755
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发表时间：
2006-05-01
影响因子：
2.6
通讯作者：
Chandani, Sameer M.
中科院分区：
文献类型：
--
作者：
Chandani, Sameer M.
提出了一种基于光纤的电光探头，其可以并入现有的电光采样系统。该探针通过将电光晶体附着到标准光纤的端部并使用选择性湿法蚀刻减薄到1.6 μ m的厚度而制成。共面波导结构上的电场测量验证了探针的电场感测能力。通过监测从被测电路上的导体反射回探头的功率，探头可以精确地放置在测试点上方几微米处。
A fiber-based electrooptic probe that can be incorporated into existing electrooptic sampling systems is presented. The probe is made by attaching an electrooptic crystal to the end of a standard optical fiber and thinned to a thickness of 1.6 mu m using selective wet etching. Measurements of the electric field over a coplanar waveguide structure verify the probe's ability to sense electric fields. The probe can be accurately placed a few micrometers over a test point by monitoring the power reflected back into the probe off of a conductor on a circuit under test.