Intra-unit-cell electronic nematicity of the high-T_c copper-oxide pseudogap state
Intra-unit-cell electronic nematicity of the high-T_c copper-oxide pseudogap state
复制标题
高T_c氧化铜赝能隙态的晶胞内电子向列性
作者：
K. Inoue;T. Muranaka et al.;M.J.Lawler
