Quantifying residual stress in Helium-implanted surfaces and its implication for blistering
Quantifying residual stress in Helium-implanted surfaces and its implication for blistering
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DOI：
10.1557/s43578-021-00108-6
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发表时间：
2021-01
影响因子：
2.7
通讯作者：
P. Hosemann;M. Sebastiani;M. Z. Mughal;X. Huang;A. Scott;M. Balooch
中科院分区：
文献类型：
--
作者：
P. Hosemann;M. Sebastiani;M. Z. Mughal;X. Huang;A. Scott;M. Balooch
氦离子注入表面是面向等离子体的材料和其他核应用的兴趣。钒作为一种代表性的体心立方材料和材料相关的融合应用注入使用氦离子束显微镜，并量化所得的溶胀和纳米机械性能。这些值被放置在相关的微观残余应力测量使用聚焦离子束为基础的环芯技术获得的数据。我们发现，测量的溶胀是类似的文献值。此外，我们能够测量由注入引起的表面应力，并发现它接近材料在起泡剂量下的屈服强度。在本工作中进行的简单计算，沿着与几个几何因素推导出的实验结果证实，气泡形成的驱动力来自主要由气体压力积累，而不仅仅是应力引起的屈曲导致的膨胀。
Helium implantation in surfaces is of interest for plasma-facing materials and other nuclear applications. Vanadium as both a representative bcc material and a material relevant for fusion applications is implanted using a Helium ion beam microscope, and the resulting swelling and nanomechanical properties are quantified. These values are put in correlation to data obtained from micro-residual stress measurements using a focused ion beam-based ring-core technique. We found that the swelling measured is similar to literature values. Further, we are able to measure the surface stress caused by the implantation and find that it approaches the yield strength of the material at blistering doses. The simple calculations performed in the present work, along with several geometrical considerations deduced from experimental results confirm the driving force for blister formation comes from bulging resulting mainly from gas pressure buildup, rather than solely stress-induced buckling.