Step-Stress Accelerated Degradation Analysis for Highly Reliable Products
Step-Stress Accelerated Degradation Analysis for Highly Reliable Products
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DOI：
10.1080/00224065.2000.11979997
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发表时间：
2000-07
影响因子：
2.5
通讯作者：
S. Tseng;Zhi-Chih Wen
中科院分区：
文献类型：
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作者：
S. Tseng;Zhi-Chih Wen
收集加速退化试验（ADT）数据可以为高可靠性产品提供有用的寿命信息，如果存在产品质量特性，其随时间的退化可能与可靠性有关。然而，进行恒定应力ADT是非常昂贵的。这显然不适用于评估新开发产品的寿命，因为通常只有少数测试样品（原型）可用。为了克服这个困难，我们提出了一个步进应力加速降解试验（SSADT）在本文中。发光二极管数据的案例研究被用来说明所提出的程序。可以看出，SSADT有几个优点，一个恒定的应力ADT。SSADT不仅大大降低了试验成本，而且为可靠性分析人员提供了评估高可靠产品寿命分布的有效工具。
Collecting accelerated degradation test (ADT) data can provide useful lifetime information for highly reliable products if there exists a product quality characteristic whose degradation over time can be related to reliability. However, conducting a constant-stress ADT is very costly. This is obviously not applicable for assessing the lifetime of a newly developed product because typically only a few test samples (prototypes) are available. To overcome this difficulty, we propose a step-stress accelerated degradation test (SSADT) in this paper. A case study of light emitting diodes data is used to illustrate the proposed procedure. It is seen that SSADT has several advantages over a constant-stress ADT. SSADT not only reduces the experimental cost significantly, but also provides the reliability analysts an efficient tool to assess the lifetime distribution of highly reliable products.