Imaging of doped holes in a cuprate superconductor with high-resolution compton scattering
Imaging of doped holes in a cuprate superconductor with high-resolution compton scattering
复制标题
利用高分辨率康普顿散射对铜酸盐超导体中的掺杂空穴进行成像
DOI：
10.1126/science.1199391
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发表时间：
2011
期刊：
影响因子：
56.9
通讯作者：
and K. Yamada
中科院分区：
文献类型：
--
作者：
Y. Sakurai;M. Itou;B. Barbiellini;P. E. Mijnarends;R. S. Markiewicz;S. Kaprzyk;J. M. Gillet;S. Wakimoto;M. Fujita;S. Basak;Yung Jui Wang;W. Al-Sawai;H. Lin;A. Bansil;and K. Yamada
高温超导铜酸盐La 2 − xSrxCuO 4（LSCO）表现出从反铁磁绝缘体到金属的多个相，并增加空穴掺杂。为了了解空穴态的性质如何随着掺杂而演变，我们在室温下对一系列LSCO单晶进行了高分辨率康普顿散射测量以及第一性原理电子结构计算，其中空穴掺杂水平从欠掺杂（UD）到过掺杂（OD）制度。发现UD系统中的空穴主要分布在O 2 px/pyorbitals上。与此相反，OD系统中的空穴的性质是非常不同的，因为这些空穴主要进入Cu d轨道。高分辨率康普顿散射为复杂材料中掺杂剂的轨道特性成像提供了一种体敏方法。
The high-temperature superconducting cuprate La2−xSrxCuO4(LSCO) shows several phases ranging from antiferromagnetic insulator to metal with increasing hole doping. To understand how the nature of the hole state evolves with doping, we have carried out high-resolution Compton scattering measurements at room temperature together with first-principles electronic structure computations on a series of LSCO single crystals in which the hole doping level varies from the underdoped (UD) to the overdoped (OD) regime. Holes in the UD system are found to primarily populate the O 2px/pyorbitals. In contrast, the character of holes in the OD system is very different in that these holes mostly enter Cu d orbitals. High-resolution Compton scattering provides a bulk-sensitive method for imaging the orbital character of dopants in complex materials.