Aggressiveness of contemporary self-etching systems. I: Depth of penetration beyond dentin smear layers
Aggressiveness of contemporary self-etching systems. I: Depth of penetration beyond dentin smear layers
复制标题
DOI：
10.1016/s0109-5641(00)00087-7
复制
发表时间：
2001-07-01
期刊：
影响因子：
5
通讯作者：
Pashley, DH
中科院分区：
文献类型：
--
作者：
Tay, FR;Pashley, DH
目的：本研究利用透射电子显微镜（TEM）检查了三种自酸蚀粘合剂系统对不同厚度的牙本质涂片层的侵蚀性。方法：用拔出的人第三磨牙制作牙本质盘。对于对照组，中间牙本质表面被冷冻断裂以形成没有涂抹层的粘合表面。实验牙齿用湿的 600 或 60 粒度碳化硅纸抛光，以产生具有薄和厚涂抹层的粘合表面。它们使用三种自蚀刻系统之一进行粘合：Clearfil Mega Bond (Kuraray)、Non-Rinse Conditioner 和 Prime&Bond NT (Dentsply DeTrey) 以及 Prompt L-Pop (ESPE)。然后将粘合样品脱盐并嵌入环氧树脂中进行 TEM 检查。结果：对于 Mega Bond，发现了 0.4-0.5 μm 之间的薄真实混合层。涂抹层和涂抹塞被保留作为杂交复合体的一部分。对于免冲洗护发素/Prime&Bond NT，真正的混合层厚度在 1.2-2.2 微米之间。涂片层薄的涂片层和涂片塞完全溶解在牙本质中，但涂片层厚的涂片层和涂片塞部分保留作为杂交复合体的一部分。对于 Prompt L-Pop，真正的混合层厚度为 2.5-5 μm，即使在具有厚涂抹层的牙本质中，涂抹层和涂抹塞也完全溶解。意义：当代自酸蚀系统可根据其穿透牙本质涂抹层的能力以及其脱矿到牙本质表面下的深度分为轻度、中度和侵蚀性。更具侵蚀性的系统完全溶解了涂抹层和涂抹塞，并形成了厚度接近磷酸处理的牙本质的混合层。 (C) 2001 年牙科材料学会。由爱思唯尔科学有限公司出版。保留所有权利。
Objective: This study examined, with the use of transmission electron microscopy (TEM), the aggressiveness of three self-etching adhesive systems in penetrating dentin smear layers of different thickness.Methods: Dentin disks were produced from extracted human third molars. For the control group, the middle dentin surface was cryo-fractured to create a bonding surface that was devoid of a smear layer. The experimental teeth were polished with wet 600 or 60-grit SiC paper to produce bonding surfaces with thin and thick smear layers. They were bonded using one of the three self-etching systems: Clearfil Mega Bond (Kuraray), Non-Rinse Conditioner and Prime&Bond NT (Dentsply DeTrey) and Prompt L-Pop (ESPE). Bonded specimens were then demineralized and embedded in epoxy resin for TEM examination.Results: For Mega Bond, thin authentic hybrid layers between 0.4-0.5 mum were found. Smear layer and smear plugs were retained as part of the hybridized complex. For Non-Rinse Conditioner/Prime&Bond NT, the authentic hybrid layers were between 1.2-2.2 mum thick. Smear layer and smear plugs were completely dissolved in dentin with thin smear layers, but were partially retained as part of the hybridized complex in those with thick smear layers. For Prompt L-Pop, authentic hybrid layers were 2.5-5 mum thick and smear layer and smear plugs were completely dissolved even in dentin with thick smear layers.Significance: Contemporary self-etching systems may be classified as mild, moderate and aggressive based on their ability to penetrate dentin smear layers and their depth of demineralization into the subsurface dentin. The more aggressive system completely solubilized the smear layer and smear plugs and formed hybrid layers with a thickness approaching those of phosphoric acid conditioned dentin. (C) 2001 Academy of Dental Materials. Published by Elsevier Science Ltd. All rights reserved.