An entanglement-enhanced microscope
An entanglement-enhanced microscope
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DOI：
10.1038/ncomms3426
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发表时间：
2013-09-01
影响因子：
16.6
通讯作者：
Takeuchi, Shigeki
中科院分区：
文献类型：
--
作者：
Ono, Takafumi;Okamoto, Ryo;Takeuchi, Shigeki
在光学相位测量的应用中，微分干涉衬度显微镜被广泛用于不透明材料或生物组织的评估。然而，给定光强度的信噪比受到标准量子极限的限制，这对于其中探测光强度被限制以避免损坏样品的测量是至关重要的。只有使用N个量子关联粒子才能打破标准量子极限，其改进因子为N的根。在这里，我们报告演示的纠缠增强显微镜，这是一个共焦型差分干涉对比显微镜，其中纠缠光子对（N = 2）源用于照明。在玻璃表面上浮雕的Q形的图像以比经典光源更好的可见性获得。信噪比是标准量子极限的1.35 +/- 0.12倍。
Among the applications of optical phase measurement, the differential interference contrast microscope is widely used for the evaluation of opaque materials or biological tissues. However, the signal-to-noise ratio for a given light intensity is limited by the standard quantum limit, which is critical for measurements where the probe light intensity is limited to avoid damaging the sample. The standard quantum limit can only be beaten by using N quantum correlated particles, with an improvement factor of root N. Here we report the demonstration of an entanglement-enhanced microscope, which is a confocal-type differential interference contrast microscope where an entangled photon pair (N = 2) source is used for illumination. An image of a Q shape carved in relief on the glass surface is obtained with better visibility than with a classical light source. The signal-to-noise ratio is 1.35 +/- 0.12 times better than that limited by the standard quantum limit.