Preparation of micro- and crypto-tephras for quantitative microbeam analysis
Preparation of micro- and crypto-tephras for quantitative microbeam analysis
复制标题
用于定量微束分析的微碎屑和隐碎屑的制备
DOI：
10.1144/sp398.5
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发表时间：
2014
期刊：
影响因子：
--
通讯作者：
C. Hayward
中科院分区：
文献类型：
--
作者：
M. Hall;C. Hayward
摘要：最小的火山灰颗粒在制备用于 EPMA 和 LA-ICP-MS 定量微束化学分析时面临着特殊的挑战。高质量的抛光表面是收集高质量定量化学数据的重要先决条件，因为这些碎片也给分析带来了巨大的困难。详细描述了小至 10-50 µm 的火山灰颗粒的制备方法。该方法使用廉价、广泛可用的材料，并且很容易在制备抛光地质样品以进行微量分析的设施中实施。当使用适当的分析方案时，以这种方式制备的样品减少或消除了与小颗粒相关的微束分析的困难。
Abstract The smallest tephra grains present special challenges in their preparation for quantitative microbeam chemical analysis by EPMA and LA-ICP-MS. High-quality polished surfaces are an essential pre-requisite for the collection of high quality quantitative chemical data, as these shards also present significant difficulties for analysis. A method for the preparation of tephra grains as small as 10–50 µm is described in detail. This method uses inexpensive, widely available materials and is easily implemented in facilities in which polished geological samples are prepared for microanalysis. Samples prepared in this way reduce or eliminate the difficulties in microbeam analysis associated with small grains, when appropriate analytical protocols are used.
影响因子：
4
作者：
Abbott, Peter M.;Davies, Siwan M.;Wastegard, Stefan
通讯作者：
Wastegard, Stefan