Instrumentation for high-dose, high-resolution dosimetry for microbeam radiation therapy using samarium-doped fluoroaluminate and fluorophosphate glass plates
Instrumentation for high-dose, high-resolution dosimetry for microbeam radiation therapy using samarium-doped fluoroaluminate and fluorophosphate glass plates
复制标题
DOI：
10.1088/1361-6501/ab404e
复制
发表时间：
2020-01-01
影响因子：
2.4
通讯作者：
Kasap, S.
中科院分区：
文献类型：
--
作者：
Chicilo, F.;Okada, G.;Kasap, S.
我们发现，1% sm掺杂氟铝酸盐（FA）玻璃板和适当修饰的荧光共聚焦显微镜提供了一个优秀的辐射检测平台，用于高分辨率到微米尺度的高剂量测量。我们使用了一个定制的改进的荧光共聚焦显微镜设备扫描，分离，检测和数字化Sm3+和Sm2+离子的光致发光（PL）信号在FA和氟磷酸盐（FP）玻璃在样品表面下的显微镜的选定焦距内。详细研究了掺sm的FA和FP玻璃板对入射x射线辐射的响应(R)，其中R定义为辐照前后Sm2+和Sm3+的PL信号比值之差。我们报告了与这些sm掺杂FA和FP玻璃板在微束放射治疗（MRT）剂量测定中使用有关的一些重要问题：Sm3+到Sm2+的转换，因此R对剂量率的依赖超过四个数量级；不同浓度Sm3+掺杂的FA和FP样品在给定剂量率下R的能量依赖性；在高达2000 Gy（空气）的不同能量下R与剂量的关系及探测器校准曲线的推导；掺sm板暴露后的稳定性；当前测量技术的仪器限制。
We show that 1% Sm-doped fluoroaluminate (FA) glass plate and a suitably modified fluorescence confocal microscope provide an excellent radiation detection platform for high-dose measurements at high resolution down to the micron scale. We have used a custom-modified fluoroscopic confocal microscope apparatus to scan, separate, detect, and digitize the photoluminescence (PL) signals from Sm3+ and Sm2+ ions in both FA and fluorophosphate (FP) glasses within a selected focal depth of the microscope below the sample surface. The response (R) of Sm-doped FA and FP glass plates to incident x-ray radiation was studied in detail in which R was defined as the difference in the ratio of PL signals from Sm2+ and Sm3+ before and after irradiation. We report on a number of important issues related to the use of these Sm-doped FA and FP glass plates in microbeam radiation therapy (MRT) dosimetry: The dependence of the Sm3+ to Sm2+ conversion, and hence R on the dose rate over some four orders of magnitude; the energy dependence of R at a given dose rate for both FA and FP samples with various concentrations of Sm3+ doping; R versus dose behavior at different energies up to 2000 Gy(air) and the derivation of the detector calibration curves; the stability of the Sm-doped plates after they have been exposed; the instrumental limits of the present measurement technique.