Light detection enhanced by surface plasmon resonance in metal film
Light detection enhanced by surface plasmon resonance in metal film
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DOI：
10.1063/1.3402771
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发表时间：
2010-04
影响因子：
4
通讯作者：
M. Fukuda;T. Aihara;K. Yamaguchi;Y. Ling;Kazu Miyaji;M. Tohyama
中科院分区：
文献类型：
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作者：
M. Fukuda;T. Aihara;K. Yamaguchi;Y. Ling;Kazu Miyaji;M. Tohyama
在Au薄膜/n型Si肖特基结构中，证实了表面等离子体增强的光探测能力。Au膜中的光直接激发的电子溢出到n型硅中，这种激发被附着在Au膜上的Au纳米棒诱导的表面等离子体增强。在小于硅带隙的能量对应的波长范围内，可以清楚地观察到激发。实验证明了肖特基光电二极管的可行性，在这种光电二极管中，电子从来不是由半导体吸收产生的，而是直接在金属中激发产生的。
Light detection enhanced by surface plasmons was confirmed in Au film/n-type Si Schottky structures. Electrons excited directly with light in Au film overflowed into the n-type silicon, and this excitation was enhanced by surface plasmons induced by Au nanorods attached to the Au film. Excitation was clearly observed in a wavelength range corresponding to the energy of less than the band gap of silicon. The feasibility of Schottky-type photodiodes, in which electrons were never generated by absorption in semiconductors but directly excited in metal, was experimentally demonstrated.