Growth of a New Ordered Langasite Structure Crystal Ca3TaAl3Si2O14
Growth of a New Ordered Langasite Structure Crystal Ca3TaAl3Si2O14
复制标题
DOI：
10.1021/cg800354q
复制
发表时间：
2008-06
影响因子：
3.8
通讯作者：
J. Xin;Yanqing Zheng;Hai-kuan Kong;Hui Chen;Xiaoniu Tu;Er-wei Shi
中科院分区：
文献类型：
--
作者：
J. Xin;Yanqing Zheng;Hai-kuan Kong;Hui Chen;Xiaoniu Tu;Er-wei Shi
采用提拉法生长了一种新的具有硅酸镓结构的Ca 3 TaAl 3Si 2 O 14（CTAS）有序压电单晶，其直径为14 - 18 mm，长度为45 mm。单晶的X射线粉末衍射（XRPD）在室温下进行。计算了晶格参数。它们是a = 8.060 A，c = 4.909 A，V = 276.19 A ~ 3。X射线荧光分析用于确定晶体的离子的摩尔比。即3.049：0.945：2.975：2：13.875 Ca 2+：Ta 5+：Al 3+：Si 4+：O2−。高分辨X射线衍射（HRXRD）结果表明，CTAS晶体是免费的小角度边界。用准静态d33仪测得的压电应变常数d11为5.0pC/N。透射光谱表明，生长的晶体在200 - 800 nm的波长范围内是透明的，最高透射率超过86%。
A new ordered piezoelectric single-crystal Ca3TaAl3Si2O14 (CTAS) with langasite structure has been successfully grown with the dimensions of 14−18 mm in diameter and 45 mm in length using the Czochralski technique. The X-ray powder diffraction (XRPD) of the single crystal was performed at room temperature. The lattice parameters were calculated. They are a = 8.060 A, c = 4.909 A, V = 276.19 A3. X-ray fluorescence analysis was used to determine the molar ratio of the ions of the crystal. That is 3.049:0.945:2.975:2:13.875 Ca2+:Ta5+:Al3+:Si4+:O2−. High-resolution X-ray diffraction (HRXRD) results indicate that CTAS crystals are free of low-angle boundaries. The piezoelectric strain constant d11 measured by quasi-static d33 meter is 5.0 pC/N. The transmittance spectrum shows that the as-grown crystal is transparent in the wavelength range of 200−800 nm and the highest transmittance exceeds 86%.