Expansion Stimulated Emission Depletion Microscopy (ExSTED)

Expansion Stimulated Emission Depletion Microscopy (ExSTED)
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DOI:
10.1021/acsnano.8b00776
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发表时间:
2018-05-01
期刊:
影响因子:
17.1
通讯作者:
Ewers, Helge
Ewers, Helge
中科院分区:
材料科学1区
文献类型:
--
作者:
Gao, Mengfei;Maraspini, Riccardo;Ewers, Helge

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受激发射耗尽(STED)显微镜通常用于解析细胞的超微结构,其分辨率比衍射极限成像高出10倍。虽然STED显微镜是基于准备激发态的荧光探针与光,最近开发的扩展显微镜(ExM)提供subdiffraction分辨率通过物理放大的样品前显微镜。通过水凝胶的交联和溶胀的固定细胞的膨胀容易地将样品放大近似4倍,因此通过该因子增加有效光学分辨率。为了克服这些互补方法的当前限制,我们将ExM与STED(ExSTED)相结合,并证明与传统显微镜相比,分辨率提高了30倍(
Stimulated emission depletion (STED) microscopy is routinely used to resolve the ultrastructure of cells with a similar to 10-fold higher resolution compared to diffraction limited imaging. While STED microscopy is based on preparing the excited state of fluorescent probes with light, the recently developed expansion microscopy (ExM) provides subdiffraction resolution by physically enlarging the sample before microscopy. The expansion of the fixed cells by cross-linking and swelling of hydrogels easily enlarges the sample similar to 4-fold and hence increases the effective optical resolution by this factor. To overcome the current limits of these complementary approaches, we combined ExM with STED (ExSTED) and demonstrated an increase in resolution of up to 30-fold compared to conventional microscopy (