Microstructure and hysteresis in Co/Pt multilayers
Microstructure and hysteresis in Co/Pt multilayers
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Co/Pt 多层膜的微观结构和磁滞现象
DOI：
10.1088/0022-3727/26/10/030
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发表时间：
1993
期刊：
影响因子：
--
通讯作者：
H. W. Kesteren
中科院分区：
文献类型：
--
作者：
D. Donnet;V. Lewis;J. Chapman;K. O’Grady;H. W. Kesteren
宏观磁测量和微磁观察域结构的洛伦兹电子显微镜相结合，提供了一个强大的手段来研究磁性薄膜的行为。本文研究了两种不同的Co/Pt薄膜。相同的标本进行了类似的磁场循环中的交变梯度力磁力计（AGFM），然后在原位的电子显微镜。畴结构的尺度和畴壁钉扎的强度的差异提供了一个解释的磁滞回线和剩磁曲线的两种膜的广泛不同的形式。剩磁曲线定义了磁化强度的不可逆变化，因此我们能够直接将微观结构和磁滞特性联系起来。
The combination of macroscopic magnetic measurements and micromagnetic observations of domain structure by Lorentz electron microscopy provides a powerful means of studying the behaviour of magnetic thin films. Here two different Co/Pt films have been studied. The same specimens were subjected to similar magnetic field cycles in an alternating gradient force magnetometer (AGFM) and then in situ in the electron microscope. Differences in the scale of the domain structures and the strength of domain wall pinning provided an explanation for the widely differing forms of the hysteresis loops and remanence curves for the two films. The remanence curves define the irreversible changes in magnetization and hence we are able to relate directly the microstructure and the hysteresis properties.