Multilayer mirror and foil filter AXUV diode arrays on CDX-U spherical torus
Multilayer mirror and foil filter AXUV diode arrays on CDX-U spherical torus
复制标题
CDX-U 球形环面上的多层反射镜和箔滤光片 AXUV 二极管阵列
DOI：
10.1063/1.1323254
复制
发表时间：
2001
影响因子：
1.6
通讯作者：
R. Majeski
中科院分区：
文献类型：
--
作者：
V. Soukhanovskii;D. Stutman;M. Iovea;M. Finkenthal;H. Moos;T. Munsat;B. Jones;D. Hoffman;R. Kaita;R. Majeski
CDX-U球面环面诊断的最新升级包括两个10通道AXUV二极管阵列。多层膜反射镜（MLM）阵列使用Mo/B4 C合成多层膜结构作为色散元件来测量极向平面中的λ150 O VI亮度分布。箔片过滤器阵列具有切向视图，并配备可互换的通孔、铍和钛过滤器。这允许测量辐射功率，O VI或CV径向分布，分别。O-VI和C-V发射率和辐射功率曲线都有很高的峰值。一个新古典杂质积累机制被认为是一种解释。对于辐射功率的测量在碲100 eV的等离子体，光子能量依赖的校正必须使用，以占非线性AXUV的灵敏度范围Ephot 100 eV的。该阵列还用于表征电阻MHD现象，如低m模式，锯齿振荡和内部重联事件。基于手术的成功...
Recent upgrades to CDX-U spherical torus diagnostics include two 10-channel AXUV diode arrays. The multilayer mirror (MLM) array measures the λ150 O VI brightness profile in the poloidal plane using the Mo/B4C synthetic multilayer structures as dispersive elements. The foil filter array has a tangential view and is equipped with interchangeable clear aperture, beryllium and titanium filters. This allows measurements of radiated power, O VI or C V radial distributions, respectively. The O VI and C V emissivity and the radiated power profiles are highly peaked. A Neoclassical impurity accumulation mechanism is considered as an explanation. For radiated power measurements in the Te⩽100 eV plasmas, photon energy dependent corrections must be used in order to account for nonlinear AXUV sensitivity in the range Ephot⩽20 eV. The arrays are also used for characterization of resistive MHD phenomena, such as the low m modes, saw-tooth oscillations and internal reconnection events. Based on the successful operation ...