Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast
Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast
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使用离轴电子全息术、洛伦兹显微镜、电子衍射显微镜和微分相差分析砷化镓化合物半导体和半导体激光二极管
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
Jun Yamasaki and Naoya Shibata
中科院分区：
文献类型：
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作者：
Hirokazu Sasaki;Shinya Otomo;Ryuichiro Minato;Kazuo Yamamoto;Tsukasa Hirayama;Jun Yamasaki and Naoya Shibata
