On-device lead sequestration for perovskite solar cells
On-device lead sequestration for perovskite solar cells
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DOI：
10.1038/s41586-020-2001-x
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发表时间：
2020-02-19
期刊：
影响因子：
64.8
通讯作者：
Xu, Tao
中科院分区：
文献类型：
--
作者：
Li, Xun;Zhang, Fei;Xu, Tao
钙钛矿太阳能电池作为一种新兴的高效、低成本光伏技术（1-6），在走向商业化的道路上面临诸多障碍。设备的稳定性已经有了实质性的改进（7-10），但是潜在的铅毒性和设备的浸出问题仍然相对未被探索（11-16）。在建筑一体化光伏发电中使用钙钛矿太阳能电池时，铅泄漏的可能性可能被视为环境和公共健康风险（17-23）。在这里，我们提出了一种化学方法，用于在设备上隔离超过96%的由严重设备损坏引起的铅泄漏。在器件堆的正面和背面涂上一层吸铅材料。在前部透明导电电极的玻璃面，我们使用了一种透明的铅吸收分子膜，其中含有与铅结合强烈的膦酸基团。在背面（金属）电极侧，我们在金属电极和标准光伏填料薄膜之间放置了一层混合了铅螯合剂的聚合物薄膜。两侧的吸铅膜在受到水浸泡时膨胀吸收铅，而不是溶解，从而保持结构的完整性，以便铅在损坏后易于收集。在钙钛矿太阳能电池的正面和背面涂覆吸铅材料，可以防止损坏器件的铅浸出，不影响器件性能和长期运行稳定性。
Perovskite solar cells, as an emerging high-efficiency and low-cost photovoltaic technology(1-6), face obstacles on their way towards commercialization. Substantial improvements have been made to device stability(7-10), but potential issues with lead toxicity and leaching from devices remain relatively unexplored(11-16). The potential for lead leakage could be perceived as an environmental and public health risk when using perovskite solar cells in building-integrated photovoltaics(17-23). Here we present a chemical approach for on-device sequestration of more than 96 per cent of lead leakage caused by severe device damage. A coating of lead-absorbing material is applied to the front and back sides of the device stack. On the glass side of the front transparent conducting electrode, we use a transparent lead-absorbing molecular film containing phosphonic acid groups that bind strongly to lead. On the back (metal) electrode side, we place a polymer film blended with lead-chelating agents between the metal electrode and a standard photovoltaic packing film. The lead-absorbing films on both sides swell to absorb the lead, rather than dissolve, when subjected to water soaking, thus retaining structural integrity for easy collection of lead after damage.Using lead-absorbing materials to coat the front and back of perovskite solar cells can prevent lead leaching from damaged devices, without affecting the device performance or long-term operation stability.