Oxide Scale Stress Determination by Raman Spectroscopy Application to the NiCr/Cr2O3 System and Influence of Yttrium
Oxide Scale Stress Determination by Raman Spectroscopy Application to the NiCr/Cr2O3 System and Influence of Yttrium
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DOI:
10.1016/s1359-6462(98)00079-7
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发表时间:
1998-05
影响因子:
6
通讯作者:
G. Calvarin;A. Huntz;A. H. Goff;S. Joiret;M. Bernard
中科院分区:
文献类型:
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作者:
G. Calvarin;A. Huntz;A. H. Goff;S. Joiret;M. Bernard
The performance of nickel-based alloys as heat resistant materials is strongly dependant on their oxidation resistance. A strong resistance to oxidation of Ni-Cr alloys is expected due to the formation of a protective Cr2O3 layer which blocks the diffusion of nickel ions to the oxide scale/gas interface and prevents from fast growth of a NiO scale.Nevertheless, stresses which are created during scale growth at high temperature, or during temperature changes can lead to scale fracture, buckling and spallation, subjecting the underlying metal to renewed oxidation. Stresses encountered during the oxidation process can be broadly categorized as either growth stresses at the oxidation temperature, or thermal stresses developed during cooling. An important source of growth stress is the volume change during oxidation of the metal, characterized by the Pilling-Bedworth ratio (PBR), which is the ratio of the oxide molar volume to the molar volume of the equivalent metal in the substrate. In most cases, the oxide has a larger volume than the metal to which it is bonded (PBR 1) such that contraction of the oxide lattice occurs particularly at the metal-oxide boundary. Thus, compressive stresses are generated in the oxide layer formed at the surface of metals and metallic alloys, during the scale growth. This effect is particularly true for scales whose growth is controlled by inward anionic diffusion. Thermal stresses are due to the expansion mismatch between the scale and the substrate and are considered to be much more important than growth stresses which can be relaxed by elasto-viscoplastic deformation of both the substrate and the scale. Stresses, if they reach a critical value, lead to fracture of the scale. Thus, it is necessary to understand the processes at the origin of stress generation in oxide films in order to predict the long term behaviour of alloys. Determination of residual stresses in oxide scales therefore provides important information for the life time prediction of such alloys.